First world congress on condition monitoring 2017

Papers are invited from both academia and industry on the following major subject areas:

• Instrumentation and ITC for CM
• Certification, education and training for CM
• Maintenance
• Asset management
• Structural health monitoring
• NDT methods and technologies
• Damage, fault and failure
• Prognostics for CM
• Design and manufacturing for CM and maintenance
• Root cause analysis of faults/failures
• Sensors and actuators
• Signal and image processing, pattern recognition, finite element modelling and simulation for CM
• CM methods and technologies
• Nano-technologies for CM
• Materials

Other relevant topics are welcome. A more detailed subject breakdown is available on the congress website at www.wc-cm.org